 Exicor Birefringence Measurement Systems bring sub-nanometer level sensitivity and industrial metrology stability and repeatability to both research labs and QC applications.
Developed by Hinds Instruments in the late 1990s for the technically demanding lithography industry, the Exicor product line has evolved into a broad range of modular systems for an expanding number of applications. A large and rapidly growing installed base of Exicor systems provides metrology level birefringence measurement for optical substrates in a diverse range of leading-edge applications: thin films, laser crystals, photonic optics, LCD/Flat Panels and, of course, optical systems for semiconductor equipment.
Click on the applications to the right to learn how Exicor technology has been used in the past. Please contact Hinds Instruments to discuss your custom application.
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