Exicor Birefringence Measurement Systems Homepage



Often times, customers ask us questions such as
"How do know that the system is measuring correctly?"
"Do you have a reference standard for birefringence?"
"I have machines in different countries, how can I make sure that they are accurate?"
"Is the variability due to the sample, the machine or some other issue?"

To ensure system performance and help answer these questions, Hinds Instruments' scientists have developed reference samples that are stable over time and temperature variability.

Currently, an expensive Soleil-Babinet compensator is used as one of our tools to ensure that measurements are correct. This device allows the user to turn a micrometer to change the birefringence of the optic. We use this compensator to test the accuracy of systems and to verify measurements from system to system. However, in addition to requiring expensive equipment, these measurements are laborious and time consuming. Therefore, Hinds has developed a series of reference samples that can be used to ensure accurate measurement.

Exicor customers have a choice of several reference samples for their applications - ultra-low(~1-2nm), low (20nm) and high (~100nm)

Birefringence map

Suggested Exicor Products:
Exicor ultra-low retardation reference sample (~1-2nm)
Exicor low retardation reference sample (20nm)
Exicor high retardation reference sample (~100nm)

 
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