 For years, crossed polarizers represented the state-of-the-art in birefringence measurement that was available to researchers as well as quality control professionals. While this 1 or 2 nm level of sensitivity was sometimes sufficient, "pixel" quantification, metrology level repeatability and statistical data analysis capabilities were missing. Scientists at Hinds Instruments, drawing on more than two decades experience with photoelastic modulation technology, applied this relatively fast (50 kHz), non-mechanical, virtually pure sinusoidal "polarization switcher" to the birefringence measurement challenge. The result, now patented, was a two- and sometimes three-fold increase in the order of magnitude improvement in measurement sensitivity when compared to traditional measurement methods. This technology has been extensively published and documented. The turnkey Exicor system has made birefringence measurement intuitive and simple. And the first of it’s kind software allows for multiple views and statistical analysis of birefringence data.
1998. Development of PEM-based Birefringence Measurement System for low-level residual birefringence in optical materials.
1999. Introduction of ExicorTM Birefringence Measurement System providing breakthrough low-level (0.005 nm) birefringence capability.
2000. Exicor receives the CLEO 2000 New Product Award.
2001. Exicor®, model 150AT, receives the 2000 Photonics Circle of Excellence Award.
2001. Exicor receives the 2001 R&D 100 Award.
2003. Exicor DUV wins the 2003 R&D 100 Award.
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