Exicor Birefringence Measurement Systems Homepage



Picture of Exicor 150AT Exicor 150AT


The Exicor 150AT is used primarily for lower weight optics measuring less than 150mm. It can be adapted to fit a tilt stage and other laser sources.


SPECIFICATION:
Retardation Range:   0.005 nm to 100+ nm
Retardation Resolution / Repeatability1:   0.001 nm / ± 0.008 nm
Angular Resolution / Repeatability:   0.01º / ± 0.05º
Measurement Time2:   Up to 10 pps
Modulation Frequency:   50 kHz
Wavelength3:   632.8 nm
Spot Size:   ~  1 mm typical
Demodulation Analysis Technique:   Lock-in Amplifier
Measurement Units:   nm (retardation), º (angle)
Scan Area4:   150 mm x 150 mm
 
OPTIONS:   Tilt Stage, IR Wavelengths (please see accessories section)
APPLICATIONS:   Film; Laser Cyrstals; Optical Lithography; LCD
1 Typical performance at 5nm retardation
2 Maximum data collection speed. Sample XY scan time dependent on stage movement parameters.
3 Custom wavelengths available
4 Custom sizes wvailable
 

 Exicor 150AT
 
  ©2005 Hinds Instruments, Inc. All Rights Reserved.