Exicor Birefringence Measurement Systems Homepage



The MT-5 is an integrated system to sequentially measure linear birefringence in optical samples at multiple detection points.


Specification:
System Dimensions:  
    Source:   20" (h) x 8" (w) x 5" (d)
    Detector Modules(4):   12" (h) x 5" (w) x 5" (d)
Range:   0 to 300 nm
Retardation Resolution:   0.01 nm
Retardation Repeatability:   ±0.5 nm at Ret < 50 nm and ±1% ≥ 50 nm
Angular Resolution:   ±1°
Angular Repeatability:    

±.2º at Ret ≥ 50 nm 

Measurement Time:   0.01 second per point
Measurement Units:   nm (retardation), ° (angle)
Measurement Spot Size:   1 mm, nominal
Modulation System:   Hinds Instruments Ultra Low Birefringence Photoelastic Modulator
Modulation Frequency:   50, 60 kHz
Wavelength:   633 nm
Input Power:   110 - 230VAC, 60-60 Hz, single phase
 
 
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