Exicor Birefringence Measurement Systems Homepage



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The MT is a modular system built for OEMs and other custom applications. The laser and detector modules are aligned at the factory or on-site. This system offers the most flexibility for any measurement application.

Specification:
Maximum Sample Size:   Variable
Maximum Sample Weight:   Variable
Range:   0 to 100 nm
Resolution/Repeatability:   0.05 nm / ±0.05 nm or ±1%
Angular Resolution:   ±1 at 1 nm retardation
Measurement Time:   <2 second per point
Measurement Units:   nm (retardation), ° (angle)
Measurement Spot Size:   1 mm
Modulation System:   Hinds Instruments Ultra Low Birefringence Photoelastic Modulator
Modulation Frequency:   50 kHz
Wavelength:   632.8 nm
OPTIONS:   IR Wavelengths, Multi-order Retardation, Magnitudes High Speed Measurement Multiple, Individually Selectrable Wavelengths (please see accessories section)
APPLICATIONS:   Film; Laser Crystals; Optical Lithography; LCD
 

 Exicor MT (111KB)
 
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