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The MT-4 is suitable for applications that require both high speed and measurement of multiple orders of retardation. |
| System Dimensions: |
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| Source: |
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305" (l) x 189" (w) x 780" (h) |
| Detector: |
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240" (l) x 220" (w) x 310" (h) |
| Range: |
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0 to 4000 nm |
| Retardation Resolution: |
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0.5 nm |
| Repeatability: |
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0.05 nm or ±1% |
| Angular Resolution: |
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±1° at 0.5 nm |
| Measurement Time: |
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0.01 second per point |
| Measurement Units: |
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nm (retardation), ° (angle) |
| Measurement Spot Size: |
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1 mm, nominal |
| Modulation System: |
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Hinds Instruments Ultra Low Birefringence Photoelastic Modulator |
| Modulation Frequency: |
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50, 60 kHz |
| Wavelength: |
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633, 528 nm |
| Input Power: |
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110VAC |
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