 Exicor birefringence measurement technology, introduced in 1999 with the Model 150AT, provides leading edge customers with the world’s most technically advanced, production-worthy capability for measuring low-level birefringence. The Exicor product line is now expanded to include many OEM and special measurement applications.
LEADING EDGE SENSITIVITY AND REPEATABILITY
Using Hinds Instruments’ patented Photoelastic Modulator (PEM) technology, the system provides the most advanced levels of birefringence sensitivity available today. In addition, the PEM provides high-speed operation. Leading edge sensitivity and repeatability provide sub-nanometer levels of birefringence measurement, now critical to many applications.
CAREFULLY DESIGNED FOR SIMPLE, STRAIGHTFORWARD OPERATION
An optical sample as large as 12" X 12" can be characterized manually or automatically mapped and graphically displayed. Once a sample is placed on the translation stage, intuitive software guides the operator through the step measurement process. User interface software calculates the retardation value and angle and displays them in a variety of formats. The software also provides file management, calibration and statistical analysis features.
Click on a brochure to learn more about a specific model or contact Hinds Instruments with your custom application.
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