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Exicor Multi-line Spectroscopic Systems provide the capability to measure birefringence at different wavelengths. This modular design may be incorporated into any of our OEM or automated systems. A variety of wavelengths are available, please contact Hinds Instruments to discuss
your custom needs. |
| Maximum Sample Size: |
|
Variable, depending on model chosen |
| Retardation Range: |
|
0.005 nm to 300+ nm (Red) |
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|
0.005 nm to 250+ nm (Green) |
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|
0.005 nm to 200+ nm (Blue) |
| Retardation Resolution / Repeatability: |
|
0.001 nm / ± 0.025 nm |
| Angular Resolution / Repeatability: |
|
0.01º / ± 0.07º |
| Measurement Time: |
|
Up to 10 pps |
| Modulation Frequency: |
|
50 kHz |
| Wavelengths: |
|
436 nm / 546 nm / 633 nm |
| Spot Size: |
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Variable, 1-3 mm |
| Measurement Units: |
|
nm (retardation), ° (angle) |
| OPTIONS: |
|
High-sensitivity Option
Custom Wavelengths |
| APPLICATIONS: |
|
Film; Optical Lithography; LCD |