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Exicor Multi-line Spectroscopic Systems provide the capability to measure birefringence at different wavelengths. This modular design may be incorporated into any of our OEM or automated systems. A variety of wavelengths are available, please contact Hinds Instruments to discuss
your custom needs. |
| Maximum Sample Size: |
|
Variable, depending on model chosen |
| Wavelengths (standard): |
|
436, 546, 633 nm
Custom Options also available |
| Digital Resolution: |
|
0.001 |
| Resolution/Repeatability: |
|
0.05 nm or 0.5% |
| Angular Resolution: |
|
<0.1° at 6.nm |
| Measurement Time: |
|
1.5 seconds/data point (high sensitivity option)
5 ms per data point (Exicor MT) |
| Measurement Units: |
|
nm (retardation), ° (angle) |
| Measurement Spot Size: |
|
1 to 3 mm, nomina |
| Modulation System: |
|
Hinds Instruments Ultra Low Birefringence Photoelastic Modulator |
| Modulation Frequency: |
|
50 kHz |
| Wavelength: |
|
632.8 nm |
| OPTIONS: |
|
High-sensitivity Option
Custom Wavelengths |
| APPLICATIONS: |
|
Film; Optical Lithography; LCD |